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AIP Conference Proceedings [AIP Publishing WOMEN IN PHYSICS: 6th IUPAP International Conference on Women in Physics - Birmingham, UK (16–20 July 2017)] WOMEN IN PHYSICS: 6th IUPAP International Conference on Women in Physics - Electrical characterization of electron beam exposure induced defects in epitaxially grown n-type silicon
Danga, H. T., Auret, F. D., Tunhuma, S. M., Omotoso, E., Igumbor, E., Meyer, W. E.Volume:
2109
Year:
2019
Language:
english
DOI:
10.1063/1.5110130
File:
PDF, 799 KB
english, 2019