![](/img/cover-not-exists.png)
Study on the Connection Between the Set Transient in RRAMs and the Progressive Breakdown of Thin Oxides
Aguirre, Fernando Leonel, Rodriguez-Fernandez, Alberto, Pazos, Sebastian Matias, Sune, Jordi, Miranda, Enrique, Palumbo, FelixYear:
2019
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2922555
File:
PDF, 5.41 MB
2019