[IEEE 2019 IEEE Applied Power Electronics Conference and...

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[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Influence of the Threshold Voltage Hysteresis and the Drain Induced Barrier Lowering on the Dynamic Transfer Characteristic of SiC Power MOSFETs

Hofstetter, Patrick, Maier, Robert W., Bakran, Mark-M.
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Year:
2019
DOI:
10.1109/APEC.2019.8721772
File:
PDF, 2.90 MB
2019
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