[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Influence of the Threshold Voltage Hysteresis and the Drain Induced Barrier Lowering on the Dynamic Transfer Characteristic of SiC Power MOSFETs
Hofstetter, Patrick, Maier, Robert W., Bakran, Mark-M.Year:
2019
DOI:
10.1109/APEC.2019.8721772
File:
PDF, 2.90 MB
2019