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[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Test Circuit Analysis and Evaluation of 400 VDC Appliance Coupler
HANAOKA, Naoki, HOSHI, Hidekazu, TAKEDA, TakashiYear:
2019
DOI:
10.1109/APEC.2019.8722053
File:
PDF, 1.07 MB
2019