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[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Simulation Study on Super-Junction SiC MOSFET with Different PN Pillar Numbers
Guo, Xinyu, Tian, Xiaoli, Bai, Yun, Lei, Tianmin, Han, Zhonglin, Song, GuanYear:
2019
DOI:
10.1109/EDSSC.2019.8754095
File:
PDF, 162 KB
2019