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[IEEE 2019 Third IEEE International Conference on Robotic Computing (IRC) - Naples, Italy (2019.2.25-2019.2.27)] 2019 Third IEEE International Conference on Robotic Computing (IRC) - SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network
Lim, Dae-ui, Kim, Young-Gyu, Park, Tae-HyoungYear:
2019
DOI:
10.1109/IRC.2019.00072
File:
PDF, 429 KB
2019