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[IEEE 2019 20th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2019.3.6-2019.3.7)] 20th International Symposium on Quality Electronic Design (ISQED) - Characterization of Fast, Accurate Leakage Power Models for IEEE P2416
Gupta, Barkha, Davis, W. RhettYear:
2019
DOI:
10.1109/ISQED.2019.8697565
File:
PDF, 448 KB
2019