Investigating the latent reliability degradation of...

Investigating the latent reliability degradation of partially depleted SOI devices induced by high-energy heavy ions irradiation

Ma, Teng, Yu, Xuefeng, Paccagnella, Alessandro, Guo, Qi
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Volume:
102
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113425
Date:
November, 2019
File:
PDF, 664 KB
english, 2019
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