Investigating the latent reliability degradation of partially depleted SOI devices induced by high-energy heavy ions irradiation
Ma, Teng, Yu, Xuefeng, Paccagnella, Alessandro, Guo, QiVolume:
102
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113425
Date:
November, 2019
File:
PDF, 664 KB
english, 2019