![](/img/cover-not-exists.png)
Electrical impedance spectroscopy characterization of ZnTe thin film deposited by R-F sputtering
Chaik, M., Ben Moumen, S., Agdad, A., SambaVall, C.M., El Aakib, H., AitDads, H., Outzourhit, A., Essaleh, L.Language:
english
Journal:
Physica B: Condensed Matter
DOI:
10.1016/j.physb.2019.07.050
Date:
July, 2019
File:
PDF, 657 KB
english, 2019