Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin films
Zschiesche, H., Campos, A.P.C., Dominici, C., Roussel, L., Charai, A., Mangelinck, D., Alfonso, C.Volume:
206
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.06.007
Date:
November, 2019
File:
PDF, 2.04 MB
2019