[IEEE 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Shanghai, China (2019.5.19-2019.5.23)] 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Static and Dynamic Figures of Merits (FOM) for Superjunction MOSFETs
Kang, H., Udrea, F.Year:
2019
Language:
english
DOI:
10.1109/ISPSD.2019.8757689
File:
PDF, 524 KB
english, 2019