Atomic-force Microscopy and Its Applications || Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups
Tański, Tomasz, Staszuk, Marcin, Ziębowicz, BogusławVolume:
10.5772/in
Year:
2019
Language:
english
DOI:
10.5772/intechopen.80446
File:
PDF, 813 KB
english, 2019