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Atomic-force Microscopy and Its Applications || Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups

Tański, Tomasz, Staszuk, Marcin, Ziębowicz, Bogusław
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Volume:
10.5772/in
Year:
2019
Language:
english
DOI:
10.5772/intechopen.80446
File:
PDF, 813 KB
english, 2019
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