![](/img/cover-not-exists.png)
[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Impact of Source Engineering in Split Drain Tunnel Field Effect Transistor
Bhattacharya, Ayan, Basak, Debadipta, Reddy, S., Sarkar, Subir KumarYear:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770395
File:
PDF, 800 KB
english, 2018