Impact of bottom-gate biasing on Implant-free Junctionless...

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IEEE Electron Device Letters 2019

Impact of bottom-gate biasing on Implant-free Junctionless Ge-on-Insulator n-MOSFETs

Lim, Hyeong-Rak, Kim, Seong Kwang, Han, Jae-Hoon, Kim, Hansung, Geum, Dae-Myeong, Lee, Yun-Joong, Ju, Byeong-Kwon, Kim, Hyung-Jun, Kim, Sanghyeon
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Year:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2931410
File:
PDF, 813 KB
english, 2019
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