Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit
Al Youssef, A., Artola, L., Ducret, S., Hubert, G.Volume:
66
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2920629
Date:
July, 2019
File:
PDF, 896 KB
english, 2019