Effect of NiO x ’s film...

Journal of Sandwich Structures and Materials 2019 / 08

Effect of NiO x ’s film thickness on the electrical properties of Ni/p–NiOx/n-Si structures

Yilmaz, Mehmet, Kacus, Hatice, Grilli, Maria Luisa, Aydogan, Sakir
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Language:
english
Journal:
Journal of Sandwich Structures & Materials
DOI:
10.1177/1099636219859198
Date:
August, 2019
File:
PDF, 1.24 MB
english, 2019
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