[IEEE 2019 Silicon Nanoelectronics Workshop (SNW) - Kyoto,...

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[IEEE 2019 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2019.6.9-2019.6.10)] 2019 Silicon Nanoelectronics Workshop (SNW) - Improved Gradual Reset Phenomenon in SiN x -based RRAM by Diode-Connected Structure

Kim, Min-Hwi, Bang, Suhyun, Kim, Tae-Hyeon, Lee, Dong Keun, Kim, Sungjun, Cho, Seongjae, Park, Byung-Gook
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Year:
2019
DOI:
10.23919/SNW.2019.8782935
File:
PDF, 182 KB
2019
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