Dislocations imaging in low boron doped diamond epilayers...

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Applied Surface Science 2019 / 8

Dislocations imaging in low boron doped diamond epilayers using Field Emission Scanning Electron Microscopy (FE-SEM)

Barbay, C., Saada, S., Mer-Calfati, C., Temgoua, S., Barjon, J., Arnault, J.C.
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2019.143564
Date:
August, 2019
File:
PDF, 1.08 MB
english, 2019
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