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[IEEE 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - Vancouver, BC, Canada (2019.6.12-2019.6.14)] 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - A method to classify digital images by means of statistics of a wavelet decomposition
Hernandez, Wilmar, Mendez, Alfredo, Ballesteros, Francisco, Gonzalez-Posada, Vicente, Jimenez, Jose Luis, Chinchero, Hector, Acosta-Vargas, Patricia, Zalakeviciute, RasaYear:
2019
Language:
english
DOI:
10.1109/ISIE.2019.8781229
File:
PDF, 360 KB
english, 2019