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[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Effect of Device Variation on Mapping Binary Neural Network to Memristor Crossbar Array
Yi, Wooseok, Kim, Yulhwa, Kim, Jae-JoonYear:
2019
Language:
english
DOI:
10.23919/DATE.2019.8714817
File:
PDF, 194 KB
english, 2019