Electrical Characterization of MOCVD Grown Single...

Materials Science Forum 2019 / 7 Vol. 963

Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC

Khosa, Rabia Y., Chen, J.T., Pálsson, K., Karhu, Robin, Hassan, Jawad, Rorsman, Niklas, Sveinbjörnsson, Einar Ö.
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Volume:
963
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.963.460
Date:
July, 2019
File:
PDF, 711 KB
english, 2019
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