Electromigration Mechanism of Indium-44Tin-6Zinc Alloy

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Journal of Electronic Materials 2019 / 7

Electromigration Mechanism of Indium-44Tin-6Zinc Alloy

Wang, Jingze, Mao, Dongxin, Meng, Guizhi, Shi, Lei, Chen, Hongtao, Xia, Ruihan, Li, Manning
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Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-019-07471-5
Date:
July, 2019
File:
PDF, 1.34 MB
english, 2019
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