Leakage conduction behavior for top- and bottom-contact pentacene thin film transistors
Lin, Yow-Jon, Wu, Chang-Lin, Chiang, Chia-Hung, Kuo, Po-ChihLanguage:
english
Journal:
Indian Journal of Physics
DOI:
10.1007/s12648-019-01526-3
Date:
June, 2019
File:
PDF, 500 KB
english, 2019