Negative Threshold Voltage Shift for LTPS TFTs under X-ray Irradiation and Gate Bias
Tai, Ya-Hsiang, Yeh, Shan, Chan, Po-Chun, Li, Yi-Shen, Huang, Shih-Hsuan, Tu, Cheng-Che, Chang, Ting-ChangJournal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab3157
Date:
July, 2019
File:
PDF, 842 KB
2019