Nonlinearity of the NIST Calculable Capacitor
Wang, Yicheng, Fu, Zhuang, Durand, Mathieu, Jeffery, Anne-MarieVolume:
68
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2890745
Date:
June, 2019
File:
PDF, 653 KB
2019