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[IEEE 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID) - Delhi, NCR, India (2019.1.5-2019.1.9)] 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID) - Novel Low and High Threshold TFET Based NTI and PTI Cells Benchmarked with Standard 45 nm CMOS Technology for Ternary Logic Applications
Ramakant, Ramakant, Vidhyadharan, Sanjay, Shyam, A. Krishna, Hirpara, Mohit, Chaudhary, Tanmay, Dan, Surya S.Year:
2019
DOI:
10.1109/VLSID.2019.00090
File:
PDF, 970 KB
2019