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Characterization of the electrical properties of an InN epilayer using terahertz time-domain spectroscopic ellipsometry
Morino, Kenta, Arakawa, Shingo, Fujii, Takashi, Mouri, Shinichiro, Araki, Tsutomu, Nanishi, YasushiVolume:
58
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/1347-4065/ab1394
Date:
June, 2019
File:
PDF, 1.14 MB
2019