Demonstration of 4H-SiC JFET Digital ICs Across 1000°C...

Materials Science Forum 2019 / 7 Vol. 963

Demonstration of 4H-SiC JFET Digital ICs Across 1000°C Temperature Range without Change to Input Voltages

Neudeck, Philip G., Spry, David J., Krasowski, Michael J., Prokop, Norman F., Chen, Liang Yu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
963
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.963.813
Date:
July, 2019
File:
PDF, 1.50 MB
english, 2019
Conversion to is in progress
Conversion to is failed