DefectNet – A Deep Convolutional Neural Network for...

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

DefectNet – A Deep Convolutional Neural Network for Semantic Segmentation of Crystallographic Defects in Advanced Microscopy Images

Roberts, Graham, Sainju, Rajat, Hutchinson, Brian, Toloczko, Mychailo B., Edwards, Danny J., Zhu, Yuanyuan
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Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619001557
Date:
August, 2019
File:
PDF, 579 KB
english, 2019
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