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Tracking Quantum Effects at the Nanometer Scale with EELS and Cathodoluminescence
Kociak, M., Galvao-Tizei, L. H., Lourenço-Martins, H., Campos, A., Meuret, S., Bourrellier, R., Zobelli, A., Hillenkamp, M., Blazit, J. D., Tencé, M., Stéphan, O.Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192761900549X
Date:
August, 2019
File:
PDF, 353 KB
english, 2019