A customized instrument with laser interferometry for measuring electrospun mat thickness
Zhou, Jianyu, Roberts, O. Steven, Goldwasser, Samuel M., Lei, Xia, Bokka, Sreevalli, Chase, George G.Volume:
90
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5100137
Date:
July, 2019
File:
PDF, 5.20 MB
english, 2019