Offset-Canceling Single-Ended Sensing Scheme With...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2019

Offset-Canceling Single-Ended Sensing Scheme With One-Bit-Line Precharge Architecture for Resistive Nonvolatile Memory in 65-nm CMOS

Na, Taehui, Song, Byungkyu, Choi, Sara, Kim, Jung Pill, Kang, Seung H., Jung, Seong-Ook
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2019.2925931
File:
PDF, 34 KB
english, 2019
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