Investigation of 1200 V SiC MOSFETs’ Surge Reliability

Micromachines 2019 / 07 Vol. 10; Iss. 7

Investigation of 1200 V SiC MOSFETs’ Surge Reliability

Li, Huan, Wang, Jue, Ren, Na, Xu, Hongyi, Sheng, Kuang
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Volume:
10
Journal:
Micromachines
DOI:
10.3390/mi10070485
Date:
July, 2019
File:
PDF, 5.40 MB
2019
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