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Investigation of 1200 V SiC MOSFETs’ Surge Reliability
Li, Huan, Wang, Jue, Ren, Na, Xu, Hongyi, Sheng, KuangVolume:
10
Journal:
Micromachines
DOI:
10.3390/mi10070485
Date:
July, 2019
File:
PDF, 5.40 MB
2019