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New Insight into Negative Bias Temperature Instability Degradation during Self-heating in Nanoscale Bulk FinFETs
Son, Dokyun, Hong, Kyushik, Shim, Hyewon, Pae, Sangwoo, Shin, HyungcheolYear:
2019
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2930077
File:
PDF, 352 KB
2019