Rietveld refinement of X-ray diffraction, impedance spectroscopy and dielectric relaxation of Li-doped ZnO-sprayed thin films
Salah, Mohamed, Azizi, Samir, Boukhachem, Abdelwaheb, Khaldi, Chokri, Amlouk, Mosbah, Lamloumi, JilaniVolume:
125
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-019-2911-3
Date:
September, 2019
File:
PDF, 1.95 MB
english, 2019