EELS in STEM: the “Swiss Army Knife” of Spectroscopy
Idrobo, Juan Carlos, Konečná, Andrea, Gazquez, Jaume, Hachtel, Jordan A., Lovejoy, Tracy C., Dellby, Niklas, García de Abajo, F. Javier, Kociak, Mathieu, Aizpurua, Javier, Krivanek, Ondrej L.Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619003830
Date:
August, 2019
File:
PDF, 309 KB
english, 2019