Online Error Detection Through Trace Infrastructure in ARM Microprocessors
Pena-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Morilla, Y., Martin-Holgado, P.Volume:
66
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2921767
Date:
July, 2019
File:
PDF, 33 KB
english, 2019