[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Artificial Neural Network Based Test Escape Screening Using Generative Model
Shintani, Michihiro, Inoue, Michiko, Nakamura, YoshiyukiYear:
2018
Language:
english
DOI:
10.1109/test.2018.8624821
File:
PDF, 33 KB
english, 2018