[IEEE 2018 IEEE International Test Conference (ITC) -...

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[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Artificial Neural Network Based Test Escape Screening Using Generative Model

Shintani, Michihiro, Inoue, Michiko, Nakamura, Yoshiyuki
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Year:
2018
Language:
english
DOI:
10.1109/test.2018.8624821
File:
PDF, 33 KB
english, 2018
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