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Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses
Agashkov, A. V., Kazak, N. S.Volume:
62
Language:
english
Journal:
Instruments and Experimental Techniques
DOI:
10.1134/S0020441219040018
Date:
October, 2019
File:
PDF, 712 KB
english, 2019