![](/img/cover-not-exists.png)
Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
Zhang, Yan-Yan, Cheng, Ran, Ni, Dong, Tian, Ming, Lu, Ji-Wu, Zhao, YiVolume:
28
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/28/7/078105
Date:
July, 2019
File:
PDF, 771 KB
2019