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Ni-Base Superalloy Single Crystal (SX) Mosaicity Characterized by the Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) Method
Thome, P., Medghalchi, S., Frenzel, J., Schreuer, J., Eggeler, G.Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112817
Date:
July, 2019
File:
PDF, 3.52 MB
2019