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Interference‐enhanced Raman scattering in SiO 2 /Si structures related to reflectance
Vančo, Ľubomír, Kotlár, Mário, Kadlečíková, Magdaléna, Vretenár, Viliam, Vojs, Marian, Kováč, JaroslavLanguage:
english
Journal:
Journal of Raman Spectroscopy
DOI:
10.1002/jrs.5666
Date:
August, 2019
File:
PDF, 1.35 MB
english, 2019