[IEEE 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Turin (2018.9.4-2018.9.7)] 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Efficient diagnosability assessment via ILP optimization: a railway benchmark
Basile, Francesco, De Tommasi, Gianmaria, Sterle, Claudio, Boussif, Abderraouf, Ghazel, MohamedYear:
2018
DOI:
10.1109/ETFA.2018.8502532
File:
PDF, 35 KB
2018