Impact of Etch Processes on the Chemistry and Surface States of the Topological Insulator Bi 2 Se 3
Barton, Adam, Walsh, Lee A., Smyth, Christopher M., Qin, Xiaoye, Addou, Rafik, Cormier, Christopher, Hurley, Paul K., Wallace, Robert M., Hinkle, Christopher LLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b10625
Date:
August, 2019
File:
PDF, 1.04 MB
english, 2019