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Low temperature radiation response of SiGe HBTs
Bakerenkov, A S, Felitsyn, V A, Rodin, A S, Bursian, Yu D, Pershenkov, V SVolume:
475
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/475/1/012001
Date:
February, 2019
File:
PDF, 582 KB
english, 2019