A Simple Test to Check the Inherent-Stability Proviso on...

IEEE Access 2018 Vol. 6

A Simple Test to Check the Inherent-Stability Proviso on Field-Effect Transistors

Colangeli, Sergio, Giofre, Rocco, Ciccognani, Walter, Limiti, Ernesto
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Volume:
6
Year:
2018
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2018.2862162
File:
PDF, 4.57 MB
english, 2018
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