[IEEE 2018 IEEE International Symposium on Electromagnetic...

[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Analysis of the accuracy and limitation of contour integral equation modeling of planar structures

Li, Kangning, Zhao, Huapeng, Chen, Zhizhang, Hu, Jun

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Year:

2018

Language:

english

DOI:

10.1109/ISEMC.2018.8393928

File:

PDF, 746 KB

english, 2018

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