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[IEEE 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Austin, TX (2018.9.24-2018.9.26)] 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Simulations of Self-Heating Effects in SiGe pFinFETs Based on Self-Consistent Solution of Carrier/Phonon BTE Coupled System
Pham, Anh-Tuan, Jin, Seonghoon, Lu, Yang, Park, Hong-Hyun, Choi, Woosung, Pourghaderi, Mohammad Ali, Kim, Jongchol, Kwon, Uihui, Kim, DaesinYear:
2018
Language:
english
DOI:
10.1109/SISPAD.2018.8551670
File:
PDF, 350 KB
english, 2018