Detection of the Defective Vias in SIW Circuits From...

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IEEE Transactions on Microwave Theory and Techniques 2019

Detection of the Defective Vias in SIW Circuits From Single/Array Probe(s) Data Using Source Reconstruction Method and Machine Learning

Alavi, Rezvan Rafiee, Mirzavand, Rashid, Kiaee, Ali, Patton, Ruska, Mousavi, Pedram
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2019.2931298
File:
PDF, 5.10 MB
english, 2019
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