[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey,...

  • Main
  • [IEEE 2019 IEEE 37th VLSI Test...

[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test

Ban, Cheng, Wu, Minshun, Xu, Jiangtao, Geng, Li, Chen, Degang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/VTS.2019.8758601
File:
PDF, 737 KB
english, 2019
Conversion to is in progress
Conversion to is failed