[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test
Ban, Cheng, Wu, Minshun, Xu, Jiangtao, Geng, Li, Chen, DegangYear:
2019
Language:
english
DOI:
10.1109/VTS.2019.8758601
File:
PDF, 737 KB
english, 2019